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Highlights: DesignWare USB 2.0 Type-C solution, including controllers and PHYs, reduces USB silicon area by up to 50 percent on ultra-low power 40-nm and 55-nm processes Extends battery life with...
Highlights: Order of magnitude faster ATPG ensures on-time availability of patterns for testing first silicon samples Significant pattern reduction enables designers to reduce test cost or...
Highlights: Tool certification accelerates ISO 26262 functional safety qualification for automotive ICs up to the most stringent safety requirements for ASIL D Enables automotive IC design teams...
Highlights: Evaluation of TetraMAX II demonstrated an order of magnitude speedup in runtime Achieves significant test-pattern-count reduction without impacting test coverage Synopsys, Inc....
Highlights: Thorough evaluation of TetraMAX II demonstrated significant reductions in both pattern count and runtime without impacting test coverage TetraMAX II was up and running in Toshiba's...