| Su | Mo | Tu | We | Th | Fr | Sa |
|---|---|---|---|---|---|---|
| Su | Mo | Tu | We | Th | Fr | Sa |
|---|---|---|---|---|---|---|
MOUNTAIN VIEW, Calif., Oct. 31, 2017 Highlights Index-based repair capabilities in STAR Memory System cut memory repair cycles from more than 1000 to fewer than 100 cycles by testing only faulty...
Highlights: TetraMAX II ATPG reduced test generation runtime by an order of magnitude, from an overnight run to less than one hour, while producing 50 percent fewer patterns DecaWave met their...
Synopsys, Inc. (Nasdaq: SNPS) today released the 2017 Coverity® Scan Report, which examines Open Source Software (OSS) quality and security data collected over the past decade through Coverity...
Highlights Validated solution, including DesignWare STAR Memory System, DesignWare STAR Hierarchical System, DFTMAX LogicBIST software qualification kit, and ARC HS processor, ensures high test...
Highlights: All Synopsys test platform products can be confidently used for functionally safe automotive systems Test platform tools, tool qualification report and IP certification accelerate ISO...
