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Highlights: DesignWare STAR Memory System's full suite of test, repair, and diagnostic capabilities for embedded MRAM optimize test time without sacrificing test coverage New configurable memory...
Highlights: SpyGlass DFT ADV provides ISO 26262 Single Point Fault Metric (SPFM) calculation based on the effects of soft errors Fast static analysis at the RTL- or gate-level ensures minimum...
Highlights: New test points reduce manufacturing test costs by an average of forty percent and increase defect coverage Test Fusion delivers significant reduction in test point silicon area and...
Highlights: Industry's first LPDDR5 controller, PHY, verification IP solution supports data rates up to 6400 Mbps with up to 40% less area than previous generations Complete DDR5 IP solution...
Highlights: FineSim SPICE 2018.09 delivers 3X faster runtime for analog circuits, adds RF analysis features Custom Compiler's Extraction Fusion with StarRC provides early parasitics for accurate...
