Press Releases
Press Releases are listed below in chronological order with the most recent one appearing first. Please use the tool below to search for press releases in a particular year, category or that contain a keyword. For additional search options, please use the Advanced Search tool.
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Apr 11, 2007Aart de Geus and NASA Principal Scientist Steve Squyres Address Nearly 1,600 Engineers at Seventeenth Annual User's Conference
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Apr 10, 2007Collaboration Delivers OCP-Compliant Verification Solution for Improved Interoperability and Quality of OCP designs
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Apr 5, 2007Complete 65-Nanometer Design Flow Recognized as Common Platform Technology Critical Success Factor
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Apr 4, 2007New Features Assure Library Quality and Reduce Characterization Cost
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Apr 4, 2007Liberty NCX Accelerates Delivery of Production-Quality Current-Source Libraries
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Apr 2, 2007New FastSPICE Simulation Technology Enables SPICE Accuracy with FastSPICE Performance
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Mar 30, 2007
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Mar 29, 2007UPF Compliance Will Minimize Risk and Improve Designer Productivity
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Mar 29, 2007CCS Models Significantly Improve Accuracy for 65-nm and Below Semiconductor IP
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Mar 28, 2007Flow Delivers a 5-10X Boost in Productivity for Mobile and Consumer Applications
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Mar 28, 2007Awards Bestowed at ISQED's Eighth Annual Quality Symposium
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Mar 27, 2007Higher Performance for Multi-Mode Designs Drives Selection
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Mar 27, 2007Comprehensive Implementation, System-Level and Verification Solutions Speed Time-to-Market for STi7200 Dual-Video-Stream Device
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Mar 19, 2007TetraMAX Diagnostics Now Key Ingredient of Yield Learning Systems for Nanometer Processes
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Mar 13, 2007Verification Suite Enables Measurement of Device Parameters at Advanced Technology Nodes
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Mar 7, 2007Synopsys PrimeTime and Star-RCXT Solutions Deployed at Fujitsu as Standard for 65-Nanometer Sign-OffExtends Usage of Gold Standard Sign-off Solutions to 65-nm ASIC and COT Design Flows
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Mar 7, 2007analogZONE Recognizes High Performance and Low Power Capabilities for an Optimized, Silicon-proven Solution
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Mar 6, 2007DFT MAX Reduces Test Data Volume and Test Application Time for High-Quality Testing
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Mar 6, 2007Latest CCS-based Libraries Improve Designer Productivity for Low-Power, High-Performance Designs
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Mar 5, 2007Next-Generation VMM Solution Adds Verification Planning, Applications, and Automation to Proven VMM Methodology
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Feb 27, 2007Optimized x86-64 Hardware Offers Superior Price/Performance for OPC Compared to Custom Hardware Platforms
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Feb 14, 2007First IP Provider to Pass PCI-SIG Compliance Testing With Complete PHY and Digital Controller Solution
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Feb 14, 2007Collaboration Delivers Proven Digital Controller IP and External PHY Solution
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Feb 12, 2007Topographical Technology Eliminates Iterations Between STMicroelectronics and ASIC Customers to Reduce Turnaround Time
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Feb 8, 2007Formality Provides Comprehensive Solution for Retimed Design Verification
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Feb 6, 2007Williams' Design for Test Techniques Are the Foundation for Many of Today's Leading EDA Solutions
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Jan 31, 2007
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Jan 31, 2007SPEF Extension Provides Consistent and Accurate Representation of Parasitic Sensitivity Information at 65 Nanometers and Beyond
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Jan 29, 2007Synopsys to Directly License Foundry-Portable PowerPC Cores
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Jan 24, 2007Key Technology Donated to Further OSCI Standard's Evolution
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Jan 16, 2007DFT MAX Reduces Test Data Volume, Enables Higher-Quality Production Testing
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Jan 15, 2007Unique LCD Driver Verification Solution Cuts Design Margin by 50 Percent
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Jan 9, 2007Synopsys' Galaxy Design Platform Validated With Multi-Vdd Capability for UMC's 90-nm Process
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Jan 9, 2007Ease of Migration, Strong Technology Roadmap Drive Competitive Selection
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Jan 8, 2007Synopsys SystemVerilog Solution Used to Verify Next-Generation On-Chip Interconnect Infrastructure for Networking, Peripheral and Consumer Applications
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Jan 3, 2007Orders Magma to Transfer Title of Fixed Timing Patents to Synopsys
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Dec 13, 2006New Book Teaches Techniques to Develop an Effective SVA-Based Verification Strategy
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Dec 11, 2006Enhanced STARCAD-CEL Methodology Accelerates Time-to-Market for Major Japanese Semiconductor Companies
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