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Oct 23, 2007

Synopsys Customers Accelerate Yield Learning With Converged Test and Yield Management Data Flow

New Odyssey DFT Module Connects TetraMAX Diagnostics with Odyssey Yield Management to Enable Comprehensive Failure Analysis of Production ICs

Synopsys, Inc. (NASDAQ: SNPS), a world leader in software and IP for semiconductor design and manufacturing, today announced general availability of the Odyssey Design-for-Test (DFT) module for...
Oct 23, 2007

Synopsys Recognizes Engineers' Technical Excellence With Best Paper Awards at 16th Annual SNUG Europe Conference

Popularity and Longevity of Conference Showcases User and Contributor Commitment to Solid Technical Content

MUNICH, GERMANY – October 23, 2007 - Synopsys, Inc. (Nasdaq:SNPS), a world leader in software and IP for semiconductor design and manufacturing, today announced the Best Paper Awards for the...
Oct 22, 2007

Synopsys Advances Low Power Management for Manufacturing Test

Galaxy Test Reduces Power Consumption During Test and Accelerates Design-for-Test for Low-Power Designs

Synopsys, Inc. (NASDAQ: SNPS), a world leader in software and IP for semiconductor design and manufacturing, today announced it has extended low power management capabilities in the Synopsys...
Oct 22, 2007

Synopsys Improves the Quality of Manufacturing Tests with Timing-Aware Pattern Generation

TetraMAX Small Delay Defect Test Technology Improves Test Quality vs. Existing At-Speed Test Methods

Synopsys, Inc. (NASDAQ: SNPS), a world leader in software and IP for semiconductor design and manufacturing, today announced availability...
Oct 19, 2007

Advisory/Synopsys EDA Interoperability Forum to Feature Michael Keating Keynote on Low Power Methodology

Forum also includes a live product demonstration of tool interoperability by IPL members and first public presentation of SOI Industry Consortium

Synopsys, Inc. (NASDAQ: SNPS), a world leader in software and IP for semiconductor design and manufacturing, announces that its 20th...

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