Cloud native EDA tools & pre-optimized hardware platforms
Su | Mo | Tu | We | Th | Fr | Sa |
---|---|---|---|---|---|---|
Su | Mo | Tu | We | Th | Fr | Sa |
---|---|---|---|---|---|---|
Highlights: Adds Gaussian noise model for faster long-haul optical fiber simulation Supports AIM Photonics Process Design Kit for photonic integrated circuit design Provides native 64-bit support...
Synopsys, Inc. (Nasdaq: SNPS) today announced that it has entered into an accelerated share repurchase agreement (ASR) with Wells Fargo Bank NA, to repurchase an aggregate of $100 million of...
Synopsys, Inc. (NASDAQ: SNPS) and the Indian Institute of Technology (IIT) Bombay today announced the release of a Synopsys Sentaurus™ TCAD model for negative-bias temperature instability...
Synopsys, Inc. (Nasdaq: SNPS) today reported results for its fourth quarter and fiscal year 2016. For the fourth quarter of fiscal 2016, Synopsys reported revenue of $633.7 million, compared to...
Synopsys, Inc. (Nasdaq: SNPS) has completed its acquisitions of Cigital, a privately held provider of software security managed and professional services, and Codiscope, a 2015 spinoff of Cigital...
Synopsys, Inc. (Nasdaq: SNPS) today announced that Mobileye N.V. has selected Synopsys' Z01X™ functional safety verification solution to meet ISO 26262 automotive safety compliance for...
Synopsys, Inc. (Nasdaq: SNPS) today announced that Dave DeMaria, vice president of corporate marketing, will speak at the 20th Annual Credit Suisse Technology Conference in Scottsdale, Arizona, on...
Highlights: Imagination selected DesignWare STAR Memory System with multi-memory bus (MMB) processor to broaden memory BIST implementation options for its new heterogeneous MIPS I6500 processor...
Highlights: Leading automotive semiconductor suppliers successfully deploy Synopsys' synthesis-based test solution to meet their stringent test goals for higher levels of quality, reliability and...
Highlights: Innovative slack-based cell-aware test for 7-nm designs increases defect coverage FinFET SRAM defect modeling and test algorithms enable efficient test and repair of 7-nm memories New...