Dec 11, 2007 Synopsys Star-RCXT Extraction Technology Files Silicon-Validated for TSMC 45-Nanometer Design Process
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Nov 26, 2007 Certified Wireless USB Logo Increases Customer Confidence in IP Compatibility and Interoperability
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Nov 13, 2007 New Synopsys PCX Technology Reduces Design-to-Mask Cycle Time for Designs in TSMC Advanced Technologies
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Nov 13, 2007 New DesignWare Star IP Offering Expands Silicon Deployment Options for Processor-Based Designs
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Nov 7, 2007 Design Flow Incorporates Advanced Power Management and DFM Capabilities Utilizing Synopsys' Galaxy Design Platform
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Nov 6, 2007 Low Power, Yield-optimized 45-nm USB PHY IP Accelerates Time-to-Market While Reducing Risk
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Nov 6, 2007 Composite Current Source Models Deliver 2X Tighter Accuracy and Reduce Characterization Cost by 80 Percent
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Nov 5, 2007 Companies Collaborate to Drive Increased Design and Manufacturing Productivity
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Nov 5, 2007 DesignWare Bridge IP for PCI Express Gen II to AMBA 3 AXI First to Achieve Silicon Success
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Nov 2, 2007 Working Groups for Properties and Parameters, PCells and Constraints seek to grow standards for interoperable analog and full custom design flows
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Oct 23, 2007 New Odyssey DFT Module Connects TetraMAX Diagnostics with Odyssey Yield Management to Enable Comprehensive Failure Analysis of Production ICs
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Oct 23, 2007 Popularity and Longevity of Conference Showcases User and Contributor Commitment to Solid Technical Content
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Oct 22, 2007 TetraMAX Small Delay Defect Test Technology Improves Test Quality vs. Existing At-Speed Test Methods
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Oct 22, 2007 Galaxy Test Reduces Power Consumption During Test and Accelerates Design-for-Test for Low-Power Designs
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Oct 19, 2007 Forum also includes a live product demonstration of tool interoperability by IPL members and first public presentation of SOI Industry Consortium
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Oct 5, 2007 Standardization on SystemVerilog with Synopsys VCS, VCS Verification Library (VIP) and VMM Methodology Enabled 15 First-Pass Verification Successes in One Year
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Oct 2, 2007 Sandwork's Technologies Expand Synopsys' Portfolio with Advanced Analog and Mixed-signal Verification Solutions
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Sep 27, 2007 Advanced Delay Test Capabilities in TetraMAX Improve At-Speed Test Quality
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Sep 26, 2007 Largest User Conference Program in EDA Annually Attracts More Than 5,000 Engineers Worldwide in Nine Locations
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Sep 26, 2007 ARM Delivers Advanced Technology-Node Physical IP with Faster, More Accurate Simulation
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Sep 25, 2007 Synopsys Technology and Expertise Help Set Up Design Center To Serve Customers Worldwide
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